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The determination of on-wafer noise parameters at W-band

Alam, TA, Pollard, RD and Snowden, CM (1997) The determination of on-wafer noise parameters at W-band In: 27th European Microwave Conference and Exhibition- Bridging the Gap Between Industry and Academia (EuMC 97), 1997-09-08 - 1997-09-12, JERUSALEM, ISRAEL.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Divisions : Surrey research (other units)
Authors :
Alam, TA
Pollard, RD
Date : 1 January 1997
DOI : 10.1109/EUMA.1997.337873
Contributors :
publisherI E E E,
Uncontrolled Keywords : Science & Technology, Technology, Engineering, Electrical & Electronic, Engineering
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 16 May 2017 12:33
Last Modified : 23 Jan 2020 13:23

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